Atomic Force Microscopy (AFM) Comprehensive Cheat Sheet
Introduction: What is Atomic Force Microscopy? Atomic Force Microscopy (AFM) is a powerful scanning probe microscopy technique that enables nanoscale imaging and characterization of surfaces with atomic resolution. Invented in 1986 by Gerd Binnig, Calvin Quate, and Christoph Gerber, AFM measures the forces between a sharp probe tip attached to a cantilever and a sample […]
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